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Mohammad Tayeb Al Qaseer (S’01–M’10–SM’12) received the B.S. degree (Magna Cum laude) in electrical engineering from the American University of Sharjah (AUS), Sharjah, United Arab Emirates, in 2002, and the M.S. and Ph.D. degrees in electrical engineering from the Missouri University of Science and Technology (formerly University of Missouri-Rolla), MO, USA, in 2004 and 2009, respectively.
He is currently a Research Associate Professor with the Electrical and Computer Engineering Department, Iowa State University, Ames, IA, USA. He has authored over 55 journal articles, and over 85 conference proceedings and presentations. He has 19 awarded and pending patents in the areas of microwave and millimeter-wave imaging and nondestructive testing. His research interest is in the areas of microwave and millimeter-wave instrumentation and measurement and its application for holographical measurement and 3-D synthetic aperture radar (SAR) imaging. His other interests include RF circuits, antennas, and numerical electromagnetic analysis, material evaluation, and nondestructive testing.
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论文共 37 篇作者统计合作学者相似作者
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IEEE Open Journal of Instrumentation and Measurementno. 99 (2024): 1-1
IEEE Transactions on Instrumentation and Measurement (2024): 1-10
Matthew Dvorsky, Si Yuan Sim, Doyle T. Motes, Trevor Watt, Ajay Shah,Mohammad Tayeb Al Qaseer,Reza Zoughi
IEEE Trans. Instrum. Meas. (2023): 1-14
IEEE Open Journal of Instrumentation and Measurement (2023): 1-13
2023 IEEE Conference on Antenna Measurements and Applications (CAMA)pp.241-245, (2023)
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I2MTCpp.1-5, (2023)
MATERIALS EVALUATIONno. 4 (2023): 19-19
IEEE Trans. Instrum. Meas. (2023): 1-18
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