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论文共 34 篇作者统计合作学者相似作者
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Daniel Schmidt,Manasa Medikonda,Michael Rizzolo, Claire Silvestre,Julien Frougier,Andrew Greene,Mary Breton,Aron Cepler,Jacob Ofek, Itzik Kaplan,Roy Koret,Igor Turovets
Journal of Micro/Nanopatterning, Materials, and Metrologyno. 3 (2023)
D. Schmidt,M. Medikonda,M. Rizzolo, C. Silvestre,J. Frougier, A. Greene,M. Breton, A. Cepler, J. Ofele, I Kaplan, R. Koret, I Turovets
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVI (2022)
Mary A. Breton,Karen Petrillo,Jennifer Church,Luciana Meli, Jennifer Fullam,Stuart Sieg,Romain Lallement,Nelson M. Felix, Shimon Levi, Susan Zollinger, Felix Levitov,Sean Hand,
Metrology, Inspection, and Process Control XXXVI (2022)
Manasa Medikonda,Daniel Schmidt,Michael Rizzolo,Mary A. Breton,Ashim Dutta,Heng Wu, Eric R. Evarts,Aron Cepler,Roy Koret, Igor Turovets,Daniel Edelstein
Metrology, Inspection, and Process Control XXXVI (2022)
Jing Guo,Jennifer Church,Luciana Meli,Ekmini Anuja De Silva,Martin Burkhardt,Karen Petrillo,Mary Breton, Cody Murray, Lijuan Zou,Allen Gabor,Nelson Felix
EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY XII (2021)
Indira Seshadri,Jennifer Church, Prateek Hundekar,Mary Breton,Jingyun Zhang,Eric R. Miller,Andrew M. Greene,Frougier Julien, Chris Waskiewicz,Tao Li, Tsung-Sheng Kang, Daniel J. Dechene,
Extreme Ultraviolet (EUV) Lithography XII (2021)
Curtis Durfee,Subhadeep Kal,Shanti Pancharatnam, Maruf Bhuiyan, Ivo Otto,Flaugh Matthew,Jeffrey Smith, Chanemougame Daniel, Cheryl Alix,Huimei Zhou,Frougier Julien,Andrew M. Greene,
ECS Meeting Abstractsno. 4 (2021): 217-227
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