基本信息
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Bio
Ian Maclaren's research concentrates on using electron microscopy to study the structure and chemistry of materials and devices at the nanoscale and below.
Current research mainly uses either:
Quantitative electron energy loss spectroscopy including DualEELS and ultra-high energy loss spectroscopy
and/or
Scanned diffraction and 4D-STEM using fast, pixelated, direct electron detectors
These techniques are applied to a wide range of topics and materials including functional oxides, high-strength steels, optical coatings for high precision interferometry, infrared semiconductor devices, and mineral alteration in terrestrial and extraterrestrial processes.
Current research mainly uses either:
Quantitative electron energy loss spectroscopy including DualEELS and ultra-high energy loss spectroscopy
and/or
Scanned diffraction and 4D-STEM using fast, pixelated, direct electron detectors
These techniques are applied to a wide range of topics and materials including functional oxides, high-strength steels, optical coatings for high precision interferometry, infrared semiconductor devices, and mineral alteration in terrestrial and extraterrestrial processes.
Research Interests
Papers共 247 篇Author StatisticsCo-AuthorSimilar Experts
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期刊级别
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合作机构
SMALLpp.e2400646-e2400646, (2024)
JOURNAL OF MICROSCOPYno. 2 (2024): 131-139
Journal of microscopyno. 3 (2024): 278-286
arxiv(2024)
Cited0Views0Bibtex
0
0
MICROSCOPY AND MICROANALYSISno. 5 (2023): 1682-1687
arXiv (Cornell University) (2023)
O. M. Rigby, T. Richards-Hlabangana,Q. M. Ramasse,I. MacLaren,R. A. Lomas-Zapata,M. S. Rumsey,K. P. McKenna,B. G. Mendis
Microscopy and Microanalysis (2021)
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Author Statistics
#Papers: 241
#Citation: 5097
H-Index: 40
G-Index: 62
Sociability: 7
Diversity: 3
Activity: 31
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