基本信息
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Bio
Martin Foldyna was born in Ostrava, Czech Republic, in 1979. He received the M.S. degree in information technologies and applied mathematics from the Technical University of Ostrava in 2002, and the Ph.D. degree in physics from the same university in 2005. From 2005 to 2009, he was a Postdoctoral Researcher with the Laboratory of Physics of Interfaces and Thin Films (LPICM), Ecole Polytechnique, Palaiseau, France. From 2009 to 2010, he was a Guest Researcher with the National Institutes of Science and Technology, Gaithersburg, MD, USA. Since 2010, he has been a Tenured Researcher with the French National Centre for Scientific Research and LPICM. He is the author and coauthor of a chapter “Advanced mueller ellipsometry instrumentation and data analysis” in the book Ellipsometry in the Nanoscale (Berlin, Germany: Springer-Verlag, 2013), more than 40 articles in peer-reviewed journals, and 20 technical papers in Proceedings of SPIE. His research interests include optical modeling and characterization of materials and nanostructures, Mueller matrix polarimetry, metrology of microelectronics nanostructures optimization of photovoltaic device performance, and applications of nanowires for solar cells.
Research Interests
Papers共 150 篇Author StatisticsCo-AuthorSimilar Experts
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Jiushuai Xu,Andam Deatama Refino,Alexandra Delvallee, Sebastian Seibert,Christian Schwalb, Poul Erik Hansen,Martin Foldyna,Lauryna Siaudinyte,Gerry Hamdana,Hutomo Suryo Wasisto,Jonathan Kottmeier,Andreas Dietzel,
APPLIED PHYSICS REVIEWSno. 2 (2024)
NANOMATERIALSno. 14 (2023): 2061-2061
Jean-Luc Maurice,Pavel Bulkin,Eric Ngo, Weixi Wang,Martin Foldyna, Ileana Florea,Pere Roca Cabarrocas, Romuald Bejaud,Olivier Hardouin Duparc
The European Physical Journal Applied Physics (2022): 7-7
Microscopy and Microanalysis (2021)
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Author Statistics
#Papers: 149
#Citation: 2131
H-Index: 26
G-Index: 40
Sociability: 6
Diversity: 0
Activity: 0
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