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Álvaro Gómez-Pau (Member, IEEE) received the M.Sc. degree in engineering from Universitat Politècnica de Catalunya (UPC-BarcelonaTech) and the Ph.D. degree in electronics engineering from the same university in 2010 and 2017, respectively. He is a Researcher and an Assistant Professor with the Electronics Engineering Department, UPC. During the Ph.D., he has been a Visiting Scholar with the Georgia Institute of Technology, Atlanta, Georgia, USA and University of Eindhoven, Eindhoven, The Netherlands. His research interests include test, diagnosis, robustness and reliability of electrical/electronic circuits as well as alternate test methods based on machine learning strategies.
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IEEE Journal on Exploratory Solid-State Computational Devices and Circuitspp.1-1, (2023)
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ELECTRONICSno. 23 (2023): 4803
IEEE Journal on Exploratory Solid-State Computational Devices and Circuitsno. 2 (2023): 92-98
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