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个人简介
Research Interests
Currently his research interests cover these topics:
Emerging memory devices (PCM, RRAM, FeRAM): device and material characterization and modelling; performances and reliability investigation and optimization.
Electron device reliability: characterization and modelling of breakdown, BTI, current noise; defect spectroscopy from electrical measurements.
Power amplifier (PA) for RF and mm-wave applications: modelling, design and characterization of PA circuits in CMOS and BiCMOS technology: Pa reliability.
Energy harvesting systems: energy transducer characterization and modelling; design and characterization of power converters for energy harvesting and autonomous sensors.
Printed audio transducers: development, modelling and characterization of novel audio transducers (e.g. thermos-acoustic loudspeaker and microphone) exploiting printed technologies and nano-structured materials.
Flash memory devices based on Floating Gate (FG) and Charge Trapping (CT): characterization and modelling; impact of material properties; device performances and reliability optimization; radiation effects.
Currently his research interests cover these topics:
Emerging memory devices (PCM, RRAM, FeRAM): device and material characterization and modelling; performances and reliability investigation and optimization.
Electron device reliability: characterization and modelling of breakdown, BTI, current noise; defect spectroscopy from electrical measurements.
Power amplifier (PA) for RF and mm-wave applications: modelling, design and characterization of PA circuits in CMOS and BiCMOS technology: Pa reliability.
Energy harvesting systems: energy transducer characterization and modelling; design and characterization of power converters for energy harvesting and autonomous sensors.
Printed audio transducers: development, modelling and characterization of novel audio transducers (e.g. thermos-acoustic loudspeaker and microphone) exploiting printed technologies and nano-structured materials.
Flash memory devices based on Floating Gate (FG) and Charge Trapping (CT): characterization and modelling; impact of material properties; device performances and reliability optimization; radiation effects.
研究兴趣
论文共 334 篇作者统计合作学者相似作者
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B. Beltrando,M. A. Villena,A. Kumar,S. Gangopadhyay, D. Kamalanathan, E. Smith, N. Kazem, G. Saheli, S. Weeks,M. Haverty,M. Kaliappan,A. Padovani,
2024 IEEE INTERNATIONAL MEMORY WORKSHOP, IMW (2024)
IEEE Electron Device Lettersno. 2 (2024): 236-239
2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)pp.1-1, (2024)
IEEE International Reliability Physics Symposiumpp.1-5, (2024)
Bastien Bcltrando, Bruno Coppolelli, Jung-Bae Kim, Yang Ho Bae, Stephen Weeks, Lisa Enman, Ghazal Saheli, Davide Cornigli, Stuart Brinkley,Mark Saly,Luca Larcher,Dong Kil Yim,
IEEE International Reliability Physics Symposium (2024)
Andrea Palmieri, Mahdi Tavakoli,Chi Ching, Wenkai Zheng, Shi You, Xiaodong Zhang, Davide Cornigli,Michael Haverty, Navneet Singh,Luca Larcher, Monika Jamieson,Ajay Bhatnagar,
IEEE International Reliability Physics Symposiumpp.10A.3-1-10A.3-6, (2024)
2023 IEEE International Integrated Reliability Workshop (IIRW) (2023)
2023 IEEE Nanotechnology Materials and Devices Conference (NMDC)pp.805-809, (2023)
IEEE Transactions on Electron Devicesno. 4 (2023): 1808-1814
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作者统计
#Papers: 330
#Citation: 8930
H-Index: 46
G-Index: 83
Sociability: 7
Diversity: 3
Activity: 38
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