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个人简介
Laurent Artola received the M.S. degree from the University of Montpellier in 2007 and the Ph.D. degree in physics thematic in 2011. He was with NXP Semiconductor, IMEC, Belgium, on the variability of integrated FinFET transistors. He was a recipient of the best 2011 ONERA Ph.D. in physics thematic. Since 2012, he has been a Research Engineer with ONERA. He continue to work using combined TCAD and circuit simulators dedicated on the single event effects prediction and modeling in advanced electronics and systems.
研究兴趣
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Maximilien Glorieux, Thierry Bonnoit,Thomas Lange,Remi Gaillard,Issam Nofal,Laurent Artola,Christian Poivey,David Levacq, Romain Rey,Kettunen Heikki,Cesar Boatella Polo
IEEE Transactions on Nuclear Scienceno. 99 (2024): 1-1
IEEE Transactions on Nuclear Scienceno. 99 (2024): 1-1
ELECTRONICSno. 18 (2023): 3968-3968
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETspp.7-27, (2021)
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETspp.107-114, (2021)
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETspp.81-105, (2021)
Springer eBooks (2021)
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETspp.65-71, (2021)
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