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个人简介
Kuo-Hsuan Meng (S’13) received the B.S. and M.S. degrees in electronics engineering from National Chiao-Tung University, Hsinchu, Taiwan, in 2006 and 2007, respectively. He is currently pursuing the Ph.D. degree from the Department of Electrical and Computer Engineering, University of Illinois at Urbana–Champaign, Urbana, IL, USA.
He has interned with Freescale Semiconductor Inc., Tempe, AZ, USA, in 2011, GLOBALFOUNDRIES Inc. Santa Clara, CA, USA, in 2012, and Freescale Semiconductor Inc., Austin, TX, USA, in 2013 and 2014. His current research interests include characterization and modeling of integrated circuits and devices for predictive simulation of electrostatic discharge responses.
研究兴趣
论文共 14 篇作者统计合作学者相似作者
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2023 45th Annual EOS/ESD Symposium (EOS/ESD) (2023): 1-10
Microelectronics Reliability (2016): 21
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Asia-Pacific International Symposium on Electromagnetic Compatibilitypp.333.0-336.0, (2015)
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作者统计
#Papers: 14
#Citation: 184
H-Index: 8
G-Index: 13
Sociability: 3
Diversity: 1
Activity: 0
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