基本信息
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Bio
Kjell Jeppson (S’68–M’76–SM’83–LM’12) received the Ph.D. degree from the Chalmers University of Technology, Gothenburg, Sweden, in 1977, based on a thesis entitled ”Studies of metal-insulator-semiconductor structures,” the main focus of which concerned negative bias stress of metal-oxide-semiconductor capacitors—a work that by now has been cited more than 800 times.
In 1970s, he was with Rockwell International in Anaheim, CA, USA, (1973–1974), and he has been on sabbatical leaves with Southampton University, Southampton, U.K., and with Shanghai University, Shanghai, China. He is currently a Professor Emeritus with the Chalmers University of Technology. He has authored or coauthored several papers on nonvolatile memories, transistor modeling and parameter extraction, CMOS gate delay and buffer optimization, and substrate-noise coupling. He has also authored a book on semiconductor devices (in Swedish). His research interests include the use of carbon nanotubes for through-silicon-vias, and on the use of graphene for heat spreaders and for flexible teraherz detectors.
Dr. Jeppson is a member of the technical program committee of the International Conference on Microelectronic Test Structures (ICMTS).
Research Interests
Papers共 141 篇Author StatisticsCo-AuthorSimilar Experts
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IEEE TRANSACTIONS ON ELECTRON DEVICESno. 3 (2023): 1393-1400
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)no. 3 (2022): 1-6
2019 44TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ)pp.1-2, (2019)
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