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Papers共 12 篇Author StatisticsCo-AuthorSimilar Experts

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Scanning Capacitance Microscopy Application for Top-down Sample Failure Analysis on SOI and Bulk Silicon Wafers
Zin Nwe Tun,Ryan Sweeney,Kevin Davidson, Esther Chen
International Symposium for Testing and Failure Analysis ISTFA 2024 Conference Proceedings from the 50th International Symposium for Testing and Failure Analysis (2024): 370-373
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Unlocking Insights into 3D Transistor Defects: the Power of Supplementing TEM with Elemental Electron Tomography
Yu Zhang,Kevin Davidson, Po-Cheng Lu,Frieder Baumann, Travis Mitchell
International Symposium for Testing and Failure Analysis ISTFA 2024 Conference Proceedings from the 50th International Symposium for Testing and Failure Analysis (2024): 374-376
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Capacitance Characterization of Gate to LDD Overlap Region to Understand Subtle Fail Modes in Advanced Node Technologies
Satish Kodali,Edmund Banghart,Kevin Davidson, Yu Zhang,Jagar Singh,Chong Khiam Oh
International Symposium for Testing and Failure Analysis ISTFA 2019 Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis (2019)
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Overcoming the Challenges of Parallel, SRAM Shorts Test Structures with EBIRCH
Noor Jehan Saujauddin,Lloyd Smith,Randy Newkirk,Kevin Davidson,Gregory M. Johnson, Zaheer Khan, Harvey Berman,Esther P.Y. Chen
International Symposium for Testing and Failure Analysis ISTFA 2018 Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis (2018)
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Nanoprobing and EBAC for Improving Failure Analysis Success Rates on Sub-14nm Logic and SRAM
John Masnik,Noor Jehan Saujauddin,Kevin Davidson,Esther P.Y. Chen
International Symposium for Testing and Failure AnalysisISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis (2018)
Cited1Views0Bibtex
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Author Statistics

#Papers: 12

#Citation: 7

H-Index: 1

G-Index: 2

Sociability: 3

Diversity: 1

Activity: 0

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