Junlin Bao received the Ph.D. degree in microelectronics from Xidian University, Xi'an, China, in 2005.
He is an Associate Professor with the School of Microelectronics, Xidian University. From July 2013 to July 2014, he was a Visiting Research Scholar with Université Paris Sud, Paris, France. He has authored or coauthored more than 80 journal and conference papers. His current research interests include integrated circuit reliability, communication system integration technology, and semiconductor power devices.