Jung-Bae Lee - Samsung Electronics Co., Ltd

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Papers共 3 篇Author StatisticsCo-AuthorSimilar Experts

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A Study on the Early Detection of Metal Line Bridge Defects Using Wafer Burn-in Stress

Kyunghwui Min, Hayoung Kwon, Seihui Lee, Heeil Hong,Sungsoo Yim, Jonghoon Kim,Jung-Bae Lee

International Symposium for Testing and Failure AnalysisISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis (2020)

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Cell Charge Loss by Formation of Inversion Channel in DRAM

Hoonchang Yang,Keunchul Ryu, Dongin Seo,Kyoungrak Cho, Junsik Park,Incheol Nam,Daesun Kim, Heeil Hong,Sungsoo Yim,Jonghoon Kim,Jung-Bae Lee

International Symposium for Testing and Failure AnalysisISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis (2020)

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Statistical Failure Analysis for Non-Parametric Characteristic in DRAM

Myunghoon Oak,Jongbum Lee, Jungwon Bae, Kyungrak-Cho, Minju-Shin, Choongsun Park,Sunghoon Park,Hongsun Hwang,Taeyoung Oh,Jonghoon Kim,Jungbae Lee

International Symposium for Testing and Failure AnalysisISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis (2019)

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