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个人简介
Juergen Alt received the PhD degree from University of Hannover,
Germany. He is with Intel's Communication Devices Group and responsible for Design-for-Test methodology. He is
based in Munich, Germany and started his industrial career in 1995 with Siemens Semiconductors Group which became
Infineon Technologies in 1999. Since 2011 he is with Intel Germany. His work covers design-for-test, test and
reliability as well as electronic design automation topics. He has published several papers and served within multiple
program committees. He was invited as key note speaker for workshops, conferences and academic colloquia. Juergen is a
regular lecturer at University of Erlangen, Germany and senior member of the IEEE.
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