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Judith Berens was born in Koblenz, Germany, in 1993. She received the M.Sc. degree in electrical engineering from RWTH Aachen University, Aachen, Germany, in 2018. She is currently pursuing the Ph.D. degree in electrical engineering with TU Vienna, Vienna, Austria, and Kompetenzzentrum Automobil- und Industrieelektronik GmbH, Villach, Austria. Her research interests include the performance and reliability of SiC MOSFETs.
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论文共 14 篇作者统计合作学者相似作者
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Maximilian W. Feil, Katja Waschneck,Hans Reisinger,Judith Berens,Thomas Aichinger, Sven Prigann, Gregor Pobegen, Paul Salmen,Gerald Rescher,Dominic Waldhoer, Aleksandr Vasilev,Wolfgang Gustin,
IEEE Transactions on Electron Devicesno. 99 (2024): 1-8
Tibor Grasser,Maximilian W. Feil, Katja Waschneck,Hans Reisinger,Judith Berens,Dominic Waldhoer, Aleksandr Vasilev,Michael Waltl,Thomas Aichinger, Michel Bockstedte,Wolfgang Gustin,Gregor Pobegen
IEEE Transactions on Electron Devicesno. 99 (2024): 1-9
2023 IEEE International Reliability Physics Symposium (IRPS)pp.1-10, (2023)
Maximilian W. Feil, Katja Waschneck,Hans Reisinger,Judith Berens,Thomas Aichinger, Sven Prigann, Gregor Pobegen, Paul Salmen,Gerald Rescher,Wolfgang Gustin,Tibor Grasser
2023 IEEE International Integrated Reliability Workshop (IIRW)pp.1-9, (2023)
Microelectronics Reliability (2022): 114789
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