Joon-Seo Yim - Department of Electrical Engineering, KAIST

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论文共 29 篇作者统计合作学者相似作者

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An Indirect Time-of-Flight CMOS Image Sensor Achieving Sub-ms Motion Lagging and 60fps Depth Image from On-chip ISP

Jiheon Park,Daeyun Kim,Hoyong Lee,Seung-Chul Shin,Myoungoh Ki,Bumsik Chung,Myunghan Bae,Myeonggyun Kye,Jonghan Ahn, Inho Song,Sunhwa Lee,Jaeil An,Il-Pyeong Hwang,Taemin An,Young-Gu Jin,Youngchan Kim,Youngsun Oh,Juhyun Ko,Haechang Lee,Joonseo Yim

2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (2023)

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A 0.64μm 4-Photodiode 1.28μm 50mpixel CMOS Image Sensor with 0.98E- Temporal Noise and 20Ke- Full-Well Capacity Employing Quarter-Ring Source-Follower

Hyuncheol Kim,Yun Hyeok Kim,Sanghyuck Moon,Hwanwoong Kim, Byeongjun Yoo, Jueun Park,Seyoung Kim,June-Mo Koo, Sewon Seo,Hye Ji Shin,Younghwan Choi, Jinwoo Kim, Kyungil Kim, Jae-Hoon Seo,Seunghyun Lim,Taesub Jung,Howoo Park,Sangil Jung,Juhyun Ko,Kyungho Lee,JungChak Ahn,JoonSeo Yim

2023 IEEE International Solid- State Circuits Conference (ISSCC) (2023)

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Optical Design of Dispersive Metasurface Nano-Prism Structure for High Sensitivity CMOS Image Sensor

Chulsoo Choi,Jonghoon Park,Yunki Lee,Bumsuk Kim, Junghoon Kim, Sunwook Kim, Junghyun Kim,Sookyoung Roh,Sungmo Ahn,Sangeun Mun,Beomsuk Lee,Seungjoo Nah,Howoo Park,Hyunchul Kim,Changrok Moon,Seokho Yun,Jungchak Ahn,Joonseo Yim

2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)

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A 0.6 ㎛ Small Pixel for High Resolution CMOS Image Sensor with Full Well Capacity of 10, 000E- by Dual Vertical Transfer Gate Technology

Jungbin Yun,Seungjoon Lee,Seungwon Cha,Jihun Kim, Jeongho Lee,Hanseok Kim, Eungkyu Lee,Seonok Kim, Seunghan Hong,Hyungchae Kim, Jinsuk Huh,Sungchul Kim, Kazunori Kakehi,Jae-Ho Kim,June-Mo Koo, Eunsang Cho,Heegeun Jeong,Howoo Park,Kyungho Lee,JungChak Ahn,JoonSeo Yim

2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)（2022）

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Color Image Distortion Assessment Based on Synthetic Ground Truth Recovery

Jungmin Lee,Seunghyeok June,Jiyun Bang,Sung-Su Kim,Joonseo Yim

Electronic Imaging（2022）

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Image Quality Performance of CMOS Image Sensor Equipped with CMY Color Filter

Sungho Cha, Suhyun Cho,Daeil Yu, Minhyuk Lee, Kaeul Lee, Byoungho Gong, Sang-Woo Lee,Sung-Su Kim,Joonseo Yim

Electronic Imagingno. 9 (2022): 195-4

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Generation of Reference Images Using Filtered Radon Transform and Truncated SVD for Structural Artifacts

Seungwan Jeon,Yukyung Lee,Kundong Kim,Daeil Yu,Sung-Su Kim,Joonseo Yim

Electronic Imaging（2022）

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Image Distortion Inference Based on Correlation Between Line Pattern and Character

Sungho Gil,Ohyeong Kim,Eunji Yong,Sung-Su Kim,Joonseo Yim

Electronic Imagingno. 9 (2022): 343-4

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Advanced Novel Optical Stack Technologies for High SNR in CMOS Image Sensor

Hye Yeon Park,Yunki Lee,Jonghoon Park,Hyunseok Song,Taesung Lee, Hyung Keun Gweon,Yunji Jung,Jeongmin Bae,Boseong Kim,Junwon Han,Seungwon Kim,Cheolsang Yoon, Jeongki Kim,Changkeun Lee, Sehoon Yoo,Euiyeol Kim, Hyunmin Baek,Howoo Park,Bumsuk Kim,JungChak Ahn,JoonSeo Yim

2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)（2022）

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A 140 Db Single-Exposure Dynamic-Range CMOS Image Sensor with In-Pixel DRAM Capacitor

Youngsun Oh,Jungwook Lim,Soeun Park,Dongsuk Yoo,Moosup Lim,Joongseok Park,Seojoo Kim,Minwook Jung,Sungkwan Kim,Junetaeg Lee,In-Gyu Baek, Kwangyul Ryu, Kyungmin Kim,Youngtae Jang,Min-Sun Keel, Gyujin Bae, Seunghun Yoo,Youngkyun Jeong,Bumsuk Kim,Jungchak Ahn,Haechang Lee,Joonseo Yim

2022 International Electron Devices Meeting (IEDM) (2022)

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