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排名必读论文期刊顶会热点AI 简史溯源树小脉星探人才迁徙塔尖人才国防情报追踪开源工具智慧手语
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On-Dual In-line Memory Module (DIMM) Low-Pass Filter (LPF) using Via Stubs for Enhancing Signal Integrity
Seungjin Lee,Jonghoon J Kim,Jinseong Yun,Heejin Cho,Youngho Lee,Kyoungsun Kim,Sungjoo Park,Jeonghyeon Cho,Hoyoung Song
2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)pp.1-3, (2022)
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Cell Charge Loss by Formation of Inversion Channel in DRAM
Hoonchang Yang,Keunchul Ryu, Dongin Seo,Kyoungrak Cho, Junsik Park, Incheol Nam,Daesun Kim, Heeil Hong,Sungsoo Yim,Jonghoon Kim,Jung-Bae Lee
International Symposium for Testing and Failure AnalysisISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis (2020)
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Statistical Failure Analysis for Non-Parametric Characteristic in DRAM
Myunghoon Oak,Jongbum Lee, Jungwon Bae, Kyungrak-Cho, Minju-Shin, Choongsun Park, Sunghoon Park,Hongsun Hwang,Taeyoung Oh,Jonghoon Kim,Jungbae Lee
International Symposium for Testing and Failure AnalysisISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis (2019)
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Improved Burn-In Stress Methodology for Stress Uniformity
Jungsuk Ko, Hoonchang yang, Hyungchae Jeon, Gyuyoung Nam, Youngseok Ryu, Changyu Park,Hongsun Hwang,Taeyoung Oh,Jonghoon Kim,Seongjin Jang
International Symposium for Testing and Failure AnalysisISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis (2018)
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Soft Single-Bit Failure on Power Fluctuation by Concurrent Operation
Keunchul Ryu, Incheol Nam,Jinseon Kim,Daesun Kim,Hongsun Hwang,Taeyoung Oh,Jonghoon Kim,Seongjin Jang
International Symposium for Testing and Failure AnalysisISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis (2018)
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