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个人简介
Jongwoo Park received the Ph.D. degree in mechanical engineering from Lehigh University, Bethlehem, PA, in 1998. His postdoctoral research at Lehigh University in 1999 included mechanical and environmental degradation of polymer encapsulated microelectronic device, polymer processing, and statistical and reliability modeling.
In 1999, he joined Lucent Technologies as a Member of Technical Staff. His research projects were packaging and reliability issues associated with application and characterization of epoxy adhesives used for fiber optical communication devices. In 2001, he joined Princeton Optronics as a Manager of Quality/Reliability. He was involved in hermetic and nonhermetic packaging and qualification and reliability of tunable laser module including microelectromechanical system, wavelength locker, and vertical cavity surface emitting laser. Since 2003, he has been with SYSTEM LSI, Samsung Electronics, Gyeonggi-do, Korea, as a Senior Quality/Reliability Manager. His primary interest is focused on reliability of the front-end-of-line and back-end-of-line process of advanced CMOS technology and development of degradation model for life projection.
研究兴趣
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SID Symposium Digest of Technical Papersno. 1 (2022): 620-623
Scientific reportsno. 1 (2021): 21805-21805
SID Symposium Digest of Technical Papersno. 1 (2020): 1251-1254
SID Symposium Digest of Technical Papersno. 1 (2020): 1319-1321
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