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My major research and development interests involve using interferometric techniques combined with computers and modern electronics to produce "state of the art" solutions for a variety of metrology problems. Particular interests are:
Demonstrating the use of microcomputers, software and interferometric techniques for measurements of optical components and optical systems, measurement of supersmooth (1 Angstrom rms or less) optical surfaces; absolute measurements of surfaces; measurement of optically rough surfaces; testing of complex aspheric surfaces; dynamic interferometers for precision surface roughness and shape measurements in manufacturing environments and the shape measurement of vibrating surfaces.
Development of commercial optical test equipment based on phase-shifting interferometry for solving metrology problems in many industries including data storage, semiconductor, machine tool, optical fabrication, fiber optics, printing and biomedical.
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INTERFEROMETRY XIX (2018)
Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series (2017): 409-416
ICPS 2013: INTERNATIONAL CONFERENCE ON PHOTONICS SOLUTIONS (2013)
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