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个人简介
Jacob Hoogenboom (1972) is assistant professor at Delft University of Technology since October 2008. He obtained his PhD in September 2002 from Utrecht University for research conducted at the FOM Institute for Atomic and Molecular Physics (AMOLF) in Amsterdam. In the following years, he worked as a postdoctoral researcher at the MESA+ Institute for Nanotechnology at University of Twente and as a research fellow at ICFO – the Institute of Photonic Sciences in Castelldefels (Barcelona) in Spain. In 2008, he spent 8 months at Utrecht University.
Research interests: electron and optical microscopy, high-resolution imaging (nanoscopy), nanophotonics, optical antennas, colloid and nanoparticle self-assembly
Research interests: electron and optical microscopy, high-resolution imaging (nanoscopy), nanophotonics, optical antennas, colloid and nanoparticle self-assembly
研究兴趣
论文共 100 篇作者统计合作学者相似作者
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Arent J. Kievits, B. H. Peter Duinkerken, Job Fermie,Ryan Lane,Ben N. G. Giepmans,Jacob P. Hoogenboom
Microscopy and Microanalysisno. S1 (2022): 1308-1309
Arent Kievits, Job Fermie, Peter Duinkerken,Ryan Lane,Elizabeth Carroll,Ben Giepmans,Jacob Hoogenboom
Microscopy and Microanalysisno. S1 (2022): 1458-1460
Ryan Lane, Luuk Balkenende, Simon van Staalduine,Anouk H. G. Wolters,Ben N. G. Giepmans, Lennard Voortman,Jacob Hoogenboom
Microscopy and Microanalysisno. S1 (2022): 1518-1520
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