基本信息
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Bio
Jimmy Price received the Ph.D. degree in physics from The University of Texas at Austin, Austin. His graduate work focused on using nonlinear (second-harmonic generation) optical methods to characterize charge trapping kinetics and defects of dielectric films and their interfaces with Si and III–V substrates.
Since 2001, he has been an Employee with SEMATECH, Austin, TX, where he has been involved with semiconductor metrology and materials characterization. His past work has focused on optical metrology methods and characterization of next-generation materials including high-$k$ gate dielectrics, metal gate electrodes, and non-Si substrates. His current research interest is applying ab initio electronic structure calculations to simulate and understand near-edge X-ray absorption spectroscopy data of surfaces and interfaces.
Research Interests
Papers共 42 篇Author StatisticsCo-AuthorSimilar Experts
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Author Statistics
#Papers: 42
#Citation: 579
H-Index: 16
G-Index: 22
Sociability: 5
Diversity: 3
Activity: 0
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