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Johnathon G. Terry received the B.Eng. (hons.) degree in electronic engineering in 1993, the M.Sc. degree in microelectronic material and device technology in 1995, and the Ph.D. degree in 1999, from the University of Manchester Institute of Science and Technology.
He joined the Institute for Integrated Micro and Nano Systems, University of Edinburgh, in 1999 as a Research Fellow. His previous work included the study of the properties and gettering of impurities in silicon. Presently, his main area of interest is in the area of MEMS structures, including involvement in a variety of projects concerned with bioMEMS, optical MEMS, microfluidics, and MEMS process development. He is also a part of the Edinburgh team funded by the DTI BEACON initiative “Understanding Genomics.”
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HEAT TRANSFER ENGINEERINGno. 4-5 (2024): 360-380
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)pp.1-5, (2024)
Anotidaishe Moyo,Muhammad Wakil Shahzad,Stewart Smith,Jonathan Terry,Yoshio Mita, Joseph Lewis,Yifan Li
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)pp.1-5, (2024)
2023 35th International Conference on Microelectronic Test Structure (ICMTS)pp.1-4, (2023)
2023 35th International Conference on Microelectronic Test Structure (ICMTS)pp.1-5, (2023)
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)pp.1-6, (2022)
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)pp.1-4, (2022)
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