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His current research interests lie in the application of synchrotron x-ray scattering techniques for studies of the structural properties of solid-liquid interfaces and of confined fluid films. Studies of this kind help us to understand the atomic-scale processes underlying melting, freezing, crystal growth and boundary lubrication. Earlier work of Friso van der Veen included the use of medium-energy ion scattering and of synchrotron radiation-based XUV electron spectroscopy and X-ray diffraction for studies of the geometric and electronic structure of single-crystal surfaces.
In 1998 Prof. van der Veen has been awarded the IUVSTA Prize by the International Union for Vacuum Science, Techniques and Applications for the above-mentioned research, in particular for his studies of surface melting. He is a corresponding member of the Royal Academy of Sciences of The Netherlands.
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Van Der Veen, J F
S Chodankar,E Perret,K Nygard,Oliver Bunk,D K Satapathy, R M Espinosa Marzal,Tobias E Balmer,Manfred Heuberger,J F Van Der Veen
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