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Papers共 88 篇Author StatisticsCo-AuthorSimilar Experts
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Masoud Dialameh, Yu-Ting Ling,Janusz Bogdanowicz, Vyacheslav S. Zharinov,Olivier Richard,Wilfried Vandervorst,Claudia Fleischmann
MICROSCOPY AND MICROANALYSIS (2024)
Janusz Bogdanowicz,Thomas Nuytten,Andrzej Gawlik,Stefanie Sergeant,Yusuke Oniki, Pallavi Puttarame Gowda,Hans Mertens,Anne-Laure Charley
NANO LETTERSno. 4 (2024): 1191-1196
Philipp Hoenicke,Andre Waehlisch,Rainer Unterumsberger,Burkhard Beckhoff,Janusz Bogdanowicz,Anne-Laure Charley,Hans Mertens, Nevine Rochat, Jean-Michel Hartmann, Narciso Giambacorti
NANOTECHNOLOGYno. 28 (2024)
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)
Cong Chen,John Slabbekoorn,Janusz Bogdanowicz,Alain Moussa,Boyao Zhang,Filip Schleicher,Peter Hoffrogge, Ingo Wiesler, Wassim Khaldi,Alain Phommahaxay,Christophe Beral,Gerald Beyer,
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)pp.320-325, (2023)
Janusz Bogdanowicz,Yusuke Oniki,Karine Kenis, Pallavi Puttarame Gowda,Hans Mertens, Basel Shamieh, Yonatan Leon,Matthew Wormington, Juliette Van der Meer,Anne-Laure Charley
JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3no. 3 (2023)
Richard Ciesielski,Leonhard M. Lohr,Hans Mertens,Anne-Laure Charley, Rudi de Ruyter,Janusz Bogdanowicz,Philipp Hoenicke, Najmeh Abbasirad,Victor Soltwisch
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)
Cong Chen,Dieter Van den Heuvel, Matteo Beggiato, Bensu Tunca Altintas,Alain Moussa,Anne Vandooren,Bart Baudemprez, Michael Schobitz, Wassim Khaldi,Janusz Bogdanowicz,Christophe Beral,Anne-Laure Charley
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)
Artem Khatchaturiants,Marta Mucientes,Arseniy Kalinin, Yan Guo, Seokhan Kim,Alain Moussa,Janusz Bogdanowicz,Joren Severi,Gian F. Lorusso,Danilo De Simone,Anne-Laure Charley,Philippe Leray,
Metrology, Inspection, and Process Control XXXVI (2022)
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Author Statistics
#Papers: 79
#Citation: 532
H-Index: 13
G-Index: 20
Sociability: 6
Diversity: 0
Activity: 1
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