Hyuck-Joon Kwon - Design Technol Team, Samsung Elect

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Papers共 3 篇Author StatisticsCo-AuthorSimilar Experts

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A novel method for improving yield prediction by matching layout pattern and defect inspection

Min-Chul Han, Chang-Hun Ko,Cheol-Hwan Kim, Masayuki Terai, Hye-Sun Kim,Oh-Hun Kwon, Ji-Hyun Cheon,Jin-Woo Choi,Jung-Hoon Park, Kyu-Sul Park, Jae-Ho Pak, Do-Youn Park,

METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)

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A machine learning based framework for correcting the interlayer misalignment of physical design in 3D-NAND flash

Cheol-Hwan Kim,Jong-Min Lee, Ji-Chang Sim, Sang-Eun Go, Hyo-Seok Woo, Dong-Yun Kim,Oh-Hun Kwon,Bo-Tak Lim, Jae-Sun Yun,Hong-Soo Kim,Hyuck-Joon Kwon,Jung-Yun Choi,

DTCO AND COMPUTATIONAL PATTERNING (2022)

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An automated system for detecting systematic defect in memory cell array

Ji-Seong Jeong, Chang-Hun Ko, Seung-Eun Yu,Oh-Hun Kwon, Tae-Hyeong Ku,Tae-Heon Kim, Dong-Won Lim,Bo-Tak Lim,Hyuck-Joon Kwon,Jung-Yun Choi,Hyung-Jong Ko

METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVI (2022)

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