Hans Dalsgaard Jensen

Hans D. Jensen was born in Bjerringbro, Denmark, in 1962. He received the M.Sc.E and the Ph.D. degrees in applied solid state physics from the Technical University of Denmark, Kongens Lyngby, Denmark, in 1988 and 1991, respectively. In 1989, he joined Danish Fundamental Metrology (DFM), Kongens Lyngby, where he was responsible for electrical primary standards. During 1991–1992, he was a Guest Scientist at NIST, Boulder, CO, USA, involved in the applications of single electron tunnelling as a standard for current and charge. In 1996, he was involved in standards in electrochemistry and focused on the establishment of a robust traceability hierarchy for electrolytic conductivity, especially at the ultralow level, at DFM. In 2016, he joined the Danish accreditation authority, as a Lead Assessor. Dr. Jensen has been an active member of International Metrology Expert Groups with EURAMET and EA, and has served as a Delegate to the CIPM CCEM until 2009 and as Delegate to CCQM until 2016.