基本信息
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个人简介
HuiJung Kim received the B.S. and M.S. degrees in physics from the Department of Physics, Yonsei University, Seoul, Korea, in 2002 and 2004, respectively. He is currently pursuing the Ph.D. degree with Seoul National University, Seoul.
He joined Samsung Electronics, Suwon, Korea, in 2004. His current research interests include the tunneling field effect transistors for low-power application and Si-based IR sensor with tunneling mechanism.
研究兴趣
论文共 291 篇作者统计合作学者相似作者
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Jongsoo Lee,Jaehyuk Jang, Wooseok Lee, Bosung Suh, Heeyong Yoo,Beomyu Park, Jeongkyun Woo, Jaeeun Jang,Inhyo Ryu,Honggul Han,Jaeyoung Kim,Byoungjoong Kang,
2024 IEEE International Solid-State Circuits Conference (ISSCC) (2024): 78-80
ALLERGY (2023): 256-256
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2023 IEEE International Reliability Physics Symposium (IRPS)pp.1-5, (2023)
Hyun-Min Kim, Hyoung Jin Choi
IEEE Transactions on Magneticsno. 2 (2021): 1-1
D. S. Kim,J. H. Bak,S. P. Ko,W. C. Lim,H. C. Shin,J. H. Lee,J. H. Park, J. H. Jeong,J. M. Lee, T. Kai, H. Sato,J. W. Lee,
2021 IEEE International Electron Devices Meeting (IEDM)pp.2.1.1-2.1.4, (2021)
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TUBERCULOSIS AND RESPIRATORY DISEASESno. 1 (2018): 42-48
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作者统计
#Papers: 290
#Citation: 7291
H-Index: 40
G-Index: 74
Sociability: 7
Diversity: 3
Activity: 2
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