基本信息
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Bio
Gurgen Harutyunyan received the bachelor’s, master’s, and Ph.D. degree from Yerevan State University, Yerevan, Armenia, in 2003, 2005, and 2008, respectively.
He is with Synopsys, Yerevan, as a Manager of Methodology Group, Department of Embedded Test and Repair. His current research interests include testing of embedded and external memories, as well as test algorithms for fault detection, diagnosis and location problems. He has published over 50 refereed papers in area of memory testing and holds four U.S. patents.
Dr. Harutyunyan was a recipient of the 2008 TTTC/ITC Commemorative Gerald W. Gordon Award, and a member of IEEE P1838 3D-Test and IEEE HJTAG 1149.10 Working Groups.
Research Interests
Papers共 60 篇Author StatisticsCo-AuthorSimilar Experts
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IEEE VLSI Test Symposiumpp.1-5, (2024)
IEEE Design & Testno. 99 (2024): 1-1
Keqing Ouyang,Minqiang Peng, Yunnong Zhu, Kang Qi,Grigor Tshagharyan,Arun Kumar,Gurgen Harutyunyan, Isaac Wang
2023 IEEE 41st VLSI Test Symposium (VTS)pp.1-4, (2023)
ETSpp.1-4, (2023)
2023 IEEE International Test Conference (ITC)pp.388-392, (2023)
2023 IEEE 41st VLSI Test Symposium (VTS)pp.1-4, (2023)
2023 IEEE International Test Conference (ITC)pp.383-387, (2023)
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