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Papers共 132 篇Author StatisticsCo-AuthorSimilar Experts
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Shogo Mochizuki,Nicolas Loubet, Pial Mirdha,Curtis Durfee,Huimei Zhou, Gen Tsusui,Julien Frougier,Reinaldo Vega,Liqiao Qin,Nelson Felix,Dechao Guo,Huiming Bu
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
C. Penny,K. Motoyama, S. Ghosh,T. Bae,N. Lanzillo,S. Sieg,C. Park, L. Zou, H. Lee,D. Metzler, J. Lee, S. Cho,
2022 International Electron Devices Meeting (IEDM)pp.34.4.1-34.4.4, (2022)
J. Wang,S. D. Suk, A. Chu,T. Hook, A. Young,R. Krishnan,R. Bao,I. Seshadri,B. Senapati,V. Zalani,T. Philip, H. Zhou,
2021 Symposium on VLSI Technologypp.1-2, (2021)
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2021 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)pp.26.1.1-26.1.4, (2021)
M. Bhuiyan,M. Kim, H. Zhou, H. Lo,S. Siddiqui,M. Stolfi, T. Guarini,R. Pujari, E. Davey, E. Stuckert, J. Li,A. Chou,
2021 IEEE International Electron Devices Meeting (IEDM)pp.1-4, (2021)
Curtis Durfee,Subhadeep Kal,Shanti Pancharatnam,Maruf Bhuiyan, Ivo Otto,Flaugh Matthew,Jeffrey Smith, Chanemougame Daniel,Cheryl Alix,Huimei Zhou,Frougier Julien,Andrew M. Greene,
ECS Meeting Abstractsno. 4 (2021): 217-227
R. Bao,C. Durfee,J. Zhang,L. Qin,J. Rozen, H. Zhou, J. Li,S. Mukesh,S. Pancharatnam, K. Zhao, C. D. Adams,E. Leobandung,
2021 IEEE International Electron Devices Meeting (IEDM)pp.26.3.1-26.3.4, (2021)
S. Mochizuki,M. Bhuiyan,H. Zhou,J. Zhang, E. Stuckert, J. Li,K. Zhao, M. Wang,V. Basker,N. Loubet,D. Guo,B. Haran,
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