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Papers共 29 篇Author StatisticsCo-AuthorSimilar Experts
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2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)pp.1-6, (2024)
International Symposium for Testing and Failure Analysis ISTFA 2022: Conference Proceedings from the 48th International Symposium for Testing and Failure Analysis (2022)
Vignesh Viswanathan,Gregory M. Johnson,Andreas Rummel, Jake R. Jokisaari,Stewart McCracken,Suzanne Costello, Aidan M. Robinson,Andrew Gibson, Alan Balfour
International Symposium for Testing and Failure Analysis ISTFA 2022: Conference Proceedings from the 48th International Symposium for Testing and Failure Analysis (2022)
Thomas Rodgers,Allen Gu,Greg Johnson,Masako Terada,Nathaniel Cohan,Vignesh Viswanathan,Michael W. Phaneuf, Joachim de Fourestier, Ethan Ruttan,Stewart McCracken,Suzanne Costello, Aidan M Robinson,
International Symposium for Testing and Failure Analysis ISTFA 2022: Conference Proceedings from the 48th International Symposium for Testing and Failure Analysis (2022)
International Symposium for Testing and Failure AnalysisISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis (2022)
International Symposium for Testing and Failure Analysis ISTFA 2022: Conference Proceedings from the 48th International Symposium for Testing and Failure Analysis (2022)
ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysispp.253-257, (2021)
International Symposium for Testing and Failure AnalysisISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis (2019)
Noor Jehan Saujauddin,Lloyd Smith,Randy Newkirk,Kevin Davidson,Gregory M. Johnson, Zaheer Khan, Harvey Berman,Esther P.Y. Chen
International Symposium for Testing and Failure AnalysisISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis (2018)
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Author Statistics
#Papers: 31
#Citation: 327
H-Index: 9
G-Index: 17
Sociability: 4
Diversity: 1
Activity: 2
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