基本信息
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Career Trajectory
Bio
Goran S. Ristić was born on August 2, 1964 in Niš, Serbia. He received the B.Sc. degree in physics at the Faculty of Natural Science and Mathematics, and the M.Sc. and Ph.D. degrees in electronics at the Faculty of Electronic Engineering, University of Niš, Serbia. Since 1990, he has been with the Faculty of Electronic Engineering, University of Niš, where he is currently a Full Professor of Physics and the Head of Applied Physics Laboratory. From 2001 to 2003, he was at the University of Toronto, Department of Medical Biophysics and Medical Imaging. As a Full Professor at the University of Niš, he has been participating in numerous research projects and teaching various courses.
His research includes radiation dosimeters, the reliability of MOS transistors, the electrical discharge and recombination processes in the afterglow periods in gases, and medical X-ray imaging. Goran Ristić is an author or co-author of more than 100 research papers, including 70 papers in well-recognized peer-reviewed journals. His papers have been cited more than 700 times (without self-citation).
He has participated in six national projects, and a FP7 project in the period 2008-12. From 2011, he has been managing an interdisciplinary national project related to the radiation measurement and protection, which gathers the researchers from four universities and eleven faculties from Serbia. In addition, from 2019 he coordinates an ELICSIR project within Horizon 2020, including the institutions from Germany, Republic of Ireland and Spain.
He has been the Conference Chairman of all International Conferences on Radiation in Various Fields of Research (RAD Conferences).
Research Interests
Papers共 127 篇Author StatisticsCo-AuthorSimilar Experts
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Book of Abstracts (2023)
2023 IEEE 33rd International Conference on Microelectronics (MIEL)pp.1-4, (2023)
Book of Abstracts (2023)
2023 IEEE 33rd International Conference on Microelectronics (MIEL)pp.1-6, (2023)
2023 26TH EUROMICRO CONFERENCE ON DIGITAL SYSTEM DESIGN, DSD 2023pp.286-293, (2023)
2023 IEEE 33rd International Conference on Microelectronics (MIEL)pp.1-4, (2023)
2023 IEEE 33rd International Conference on Microelectronics (MIEL)pp.1-4, (2023)
2023 IEEE 33rd International Conference on Microelectronics (MIEL)pp.1-4, (2023)
Book of Abstracts (2023)
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