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Research Interests

Papers共 28 篇Author StatisticsCo-AuthorSimilar Experts

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Bias and Temperature Stress Effects in IGZO TFTs and the Application of Step-Stress Testing to Increase Reliability Test Throughput
Navid Mohammadian,Dinesh Kumar,Lucas Fugikawa-Santos,Gabriel Leonardo Nogueira, Shouzhou Zhang,Neri Alves, David Ballantine,Jeff Kettle
IEEE TRANSACTIONS ON ELECTRON DEVICESno. 11 (2024): 6756-6763
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Author Statistics

#Papers: 28

#Citation: 263

H-Index: 7

G-Index: 16

Sociability: 4

Diversity: 2

Activity: 13

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