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Papers共 26 篇Author StatisticsCo-AuthorSimilar Experts
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Timothée Choisnet, Abdelali Hammouti, Vincent Gagneur,Jérôme Reche,Guido Rademaker,Guillaume Freychet, Guillaume Jullien,Julien Ducote,Patrice Gergaud,Delphine Le Cunff
Journal of Micro/Nanopatterning, Materials, and Metrologyno. 01 (2024)
Semiconductor Science and Technologyno. 5 (2023): 055011-055011
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIIno. 3 (2023)
Timothee Choisnet, Abdelali Hammouti, Vincent Gagneur,Jerome Reche,Guido Rademaker,Guillaume Freychet, Guillaume Jullien,Julien Ducote,Patrice Gergaud,Delphine Le Cunff
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)
Gabriele Seguini, Alessia Motta, Marco Bigatti, Federica E. Caligiore,Guido Rademaker,Ahmed Gharbi,Raluca Tiron, Graziella Tallarida, Michele Perego, Elena Cianci
ACS Applied Nano Materialsno. 7 (2022): 9818-9828
Thibaut Bourguignon, Bertrand Le Gratiet,Jonathan Pradelles,Sebastien Berard-Bergery,Guido Rademaker,Nicolas Posseme
37TH EUROPEAN MASK AND LITHOGRAPHY CONFERENCE (2022)
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVI (2022)
A. del Moral,E. Amat,H-j Engelmann,M-l Pourteau,G. Rademaker,D. Quirion, N. Torres-Herrero,M. Rommel,K-h Heinig,J. von Borany,R. Tiron,J. Bausells,
SEMICONDUCTOR SCIENCE AND TECHNOLOGYno. 12 (2022)
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Author Statistics
#Papers: 21
#Citation: 25
H-Index: 3
G-Index: 4
Sociability: 5
Diversity: 0
Activity: 0
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