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个人简介
4-years of experience working in electrical and thermal characterization of wide bandgap semiconductor devices (i.e. GaN HEMTs).
Familiar with the state-of-the-art testing methodologies for reliability analysis of semiconductor devices.
Skilled at data analysis and TCAD simulation tools for semiconductor devices (i.e. Ansys, Silvaco Atlas).
In-depth knowledge of semiconductor physics and technology, and the design rules for GaN-based devices.
Familiar with the state-of-the-art testing methodologies for reliability analysis of semiconductor devices.
Skilled at data analysis and TCAD simulation tools for semiconductor devices (i.e. Ansys, Silvaco Atlas).
In-depth knowledge of semiconductor physics and technology, and the design rules for GaN-based devices.
研究兴趣
论文共 6 篇作者统计合作学者相似作者
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Thomas Gerrer,James Pomeroy,Feiyuan Yang,Daniel Francis, Jim Carroll, Brian Loran, Larry Witkowski, Marty Yarborough,Michael J. Uren,Martin Kuball
IEEE TRANSACTIONS ON ELECTRON DEVICESno. 3 (2020): 869-874
user-5e9d449e4c775e765d44d7c9(2020)
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作者统计
#Papers: 6
#Citation: 29
H-Index: 3
G-Index: 5
Sociability: 3
Diversity: 0
Activity: 0
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