基本信息
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Career Trajectory
Bio
Experienced Scientist and Engineer with a demonstrated history of working in the research industry and institute. Strong research professional skilled in ANSYS, Modeling, Research and Development (R&D), Integrated Circuits (IC) packaging, material characterization, reliability and failure analysis, and Stress Analysis.
More than 150 publication in Journal and conference proceedings. Co-authored one Book. IEEE Senior Member. Peer Reviewer for more than 30 international Journals. 4 Best Paper Awards.
More than 150 publication in Journal and conference proceedings. Co-authored one Book. IEEE Senior Member. Peer Reviewer for more than 30 international Journals. 4 Best Paper Awards.
Research Interests
Papers共 171 篇Author StatisticsCo-AuthorSimilar Experts
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Materials Science in Semiconductor Processing (2024): 108560
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)pp.926-931, (2023)
2023 18th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)pp.191-194, (2023)
2023 IEEE 73RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTCpp.420-425, (2023)
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)pp.678-682, (2023)
2023 IEEE 73RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTCpp.1200-1204, (2023)
Ling Pan,Fa Xing Che, Wei Yu,Yeow Chon Ong,Hong Wan Ng, Kelvin Aik Boo Tan, Wen Wei Lum,Koustav Sinha, Ting Wen Chen
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)pp.674-677, (2023)
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC)pp.705-709, (2023)
Yun-Ting Hsu, Yung-Sheng Zou,Min-Hua Chung,Chong-Leong Gan, Venkatesh Venkatraman, Anila Paul, Winnie Low,Faxing Che
2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)pp.1-5, (2023)
Wei Yu,Faxing Che,Vance Liu, Milly Lin, Jay Lin, Brad Rumsey,Christopher Glancey,Yeow Chon Ong,Hong Wan Ng
2023 IEEE 73RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTCpp.699-705, (2023)
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