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个人简介
Erik Benkler was born in Heidelberg, Germany, in 1973. He received the M.Sc. and Ph.D. degrees in physics from Darmstadt University of Technology, Darmstadt, Germany, in 1999 and 2004, respectively.
Since 2004, he has been with the German National Metrology Institute, Physikalisch-Technische Bundesanstalt, Braunschweig, Germany, where he works as a Researcher in the field of optical femtosecond metrology.
Dr. Benkler is a member of the German Physical Society and of the Optical Society of America.
研究兴趣
论文共 67 篇作者统计合作学者相似作者
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arxiv(2023)
引用6浏览0WOS引用
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H. A. Fürst,C.-H. Yeh, D. Kalincev, A. P. Kulosa, L. S. Dreissen, R. Lange,E. Benkler, N. Huntemann, E. Peik, T. E. Mehlstäubler
Physical Review Lettersno. 14 (2022)
M. Schioppo,J. Kronjäger,A. Silva, R. Ilieva, J. W. Paterson,C. F. A. Baynham,W. Bowden,I. R. Hill,R. Hobson, A. Vianello,M. Dovale-Álvarez,R. A. Williams,
H. A. Fürst, C.-H. Yeh, D. Kalincev, A. P. Kulosa, L. S. Dreissen, R. Lange,E. Benkler, N. Huntemann, E. Peik, T. E. Mehlstäubler
Physical Review Letters (2022)
2022 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS)pp.1-2, (2022)
Metrologiano. 1 (2021)
NEW JOURNAL OF PHYSICSno. 9 (2021)
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