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Bio
Donald A. Walko received the B.S. degree in engineering physics from Cornell University, Ithaca, NY, in 1993, and the M.S. and Ph.D. degrees in physics from the University of Illinois, Urbana, in 1994 and 2000, respectively.
He is currently with the Advanced Photon Source, Argonne National Laboratory, Argonne, IL, after positions at Northwestern University and the University of Michigan. His research interests include time-resolved X-ray diffraction and X-ray scattering from surfaces and low-dimensional structures.
Dr. Walko is a member of the American Physical Society.
Research Interests
Papers共 91 篇Author StatisticsCo-AuthorSimilar Experts
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Physical Review Ano. 2 (2023)
ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS XVII (2022)
Physical Review Ano. 2 (2022)
ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS XIV (2019)
F. Chen, Y. Zhu,S. Liu, Y. Qi,H. Y. Hwang, N. C. Brandt,J. Lu,F. Quirin,H. Enquist,P. Zalden, T. Hu, J. Goodfellow,
Physical Review Bno. 22 (2018)
ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS XII (2017)
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