基本信息
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Bio
Dawei Heh (M'05) received the B.S. degree in physics from the National Taiwan University, Taipei, in 1996 and the M.S. and Ph.D. degrees in electrical engineering from the University of Maryland, College Park, in 2001 and 2005, respectively.
He was with the CMOS and Novel Devices Group, National Institute of Standards and Technology, working on studying reliability and breakdown mechanisms of ultrathin dielectrics while he was pursuing the Ph.D. degree. From 2005 to 2009, he was a Research Engineer with the Electrical Characterization and Reliability Group, SEMATECH, and is currently with the National Nano Device Laboratories (NDL), Taipei. His research interests include characterization and development of new measurement techniques for high-$k$, memory, high-speed channel, and nonplanner devices. He is also working on the simulation of electrical characteristics of high-speed channel devices.
Research Interests
Papers共 94 篇Author StatisticsCo-AuthorSimilar Experts
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mag(2014)
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IEEE ELECTRON DEVICE LETTERSno. 2 (2012): 188-190
ECS Transactionsno. 4.0 (2011): 39-53
ECS Meeting Abstractsno. 22 (2011): 1343-1343
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#Papers: 93
#Citation: 2128
H-Index: 26
G-Index: 43
Sociability: 6
Diversity: 2
Activity: 0
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