基本信息
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个人简介
David S. Simons received the Ph.D. degree in solid-state physics from the University of Illinois at Urbana-Champaign in 1973.
He is a research physicist and former group leader of the Analytical Microscopy Group, Surface and Microanalysis Science Division, Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD. He served a post-doctoral research appointment in the Materials Research Lab at the University of Illinois and was a chemist in the mass spectrometry group at the General Electric Knolls Atomic Power Laboratory, Schenectady, NY, before moving to the National Bureau of Standards (now NIST) in 1979. He has specialized in the applications of secondary ion mass spectrometry to microelectronic materials and to particle analysis.
研究兴趣
论文共 124 篇作者统计合作学者相似作者
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Journal of physics communicationsno. 3 (2020): 035006-035006
Physical Review Materialsno. 6 (2017)
Bulletin of the American Physical Society (2015)
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SURFACE AND INTERFACE ANALYSISno. 6 (2015): 681-700
Surface and Interface Analysis (2015)
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作者统计
#Papers: 123
#Citation: 2621
H-Index: 25
G-Index: 46
Sociability: 6
Diversity: 3
Activity: 0
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