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Scientist developing electron microscopy techniques to image dynamic and beam-sensitive material systems.
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Papers共 39 篇Author StatisticsCo-AuthorSimilar Experts
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ACS applied materials & interfacesno. 20 (2023): 24271-24283
John Bulmer,Michelle Durán-Chaves,Daniel M. Long,Jeremiah Lipp,Steven Williams,Mitchell Trafford, Anthony Pelton, Jared Shank,Benji Maruyama, Larry Drummy,Matteo Pasquali,Hilmar Koerner,
arXiv (Cornell University) (2023)
John Bulmer,Michelle Durán-Chaves,Daniel M Long,Jeremiah Lipp,Steven Williams,Mitchell Trafford, Anthony Pelton, Jared Shank,Benji Maruyama,Lawrence F Drummy,Matteo Pasquali,Hilmar Koerner,
Nano lettersno. 14 (2023): 6458-6464
JOURNAL OF PHYSICAL CHEMISTRY Cno. 41 (2022): 17490-17501
Scott McClary,Daniel Long,Ana Sanz-Matias, Alan Landers, Kathryn Small,Paul Kotula,David Prendergast,Katherine Jungjohann,Kevin Zavadil
Proposed for presentation at the 2022 Fall American Chemical Society Meeting held August 21-25, 2022 in Chicago, IL. (2022)
Microscopy and Microanalysisno. S1 (2022): 826-827
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