基本信息
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Bio
Damien Lambert (Senior Member, IEEE) received the Engineering degree from the École Supérieure d’Electronique de l’Ouest (E.S.E.O.), Angers, France, in 2002, the master’s degree in devices and microtechnologies from Rennes 2 University, Rennes, France, in 2002, and the Ph.D. degree from the Commissariat à l’Energie Atomique (CEA), Bruyères-le-Châtel, France, in collaboration with EADS and Montpellier II University, Montpellier, France, in 2006.
His main field of investigation was the sensitivity of integrated technologies to proton and neutron irradiations. After his Ph.D. graduation in 2006, he joined EADS Nuclétudes, Les Ulis, France, where he focused on electronic system reliability. Since 2019, he works at CEA as a Research Engineer. His main topics are the evaluation and simulations of radiation effects in electronics, photonics, and systems. He has authored or coauthored publications and presentations mainly at RADECS and NSREC (including two NSREC Outstanding Conference Paper).
Dr. Lambert is a member of the Geant4 international collaboration.
Research Interests
Papers共 41 篇Author StatisticsCo-AuthorSimilar Experts
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Damien Lambert, Sylvain Girard, Giovanni Santin,Marc Gaillardin,Adriana Morana,Arnaud Meyer,Jeoffray Vidalot,Jacques Baggio,Julien Mekki, Hugo Cintas,Olivier Duhamel,Claude Marcandella,
IEEE Transactions on Nuclear Scienceno. 99 (2024): 1-1
Julien Parize,Thomas Jarrin, Antoine Fées,Damien Lambert,Antoine Jay, Valentin Morin,Anne Hemeryck,Nicolas Richard
IEEE Transactions on Nuclear Scienceno. 99 (2024): 1-1
Neil Rostand,Damien Lambert,Olivier Duhamel,Marc Gaillardin,Mélanie Raine, Sébastien Vigne,Mamour Sall, Clara Grygiel
IEEE Transactions on Nuclear Scienceno. 99 (2024): 1-1
IEEE Transactions on Nuclear Scienceno. 4 (2023): 575-582
MICROELECTRONICS RELIABILITY (2023): 115273-115273
Journal of Applied Physicsno. 13 (2023)
IEEE Transactions on Nuclear Scienceno. 8 (2023): 1666-1672
Radiationno. 6 (2023): 58-74
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