基本信息
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Bio
Dalaver H. Anjum received the B.Sc degree in physics and mathematics from The University of Punjab, Punjab, Pakistan, in 1992, and the M.S. and Ph.D. degrees in physics from The State University of New York at Albany, in 1998 and 2002, respectively.
From October 2001 to October 2003, he was with the Department of Materials Science and Engineering, University of Virginia, Charlottesville, as a Postdoctoral Research Associate where he worked on the development of nanoscale stress characterization of SiGe-based MOSFETs. He is now with the Burnham Institute, La Jolla, CA. His research interests are the characterization of both physical and biological materials using AEM.
Research Interests
Papers共 316 篇Author StatisticsCo-AuthorSimilar Experts
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Mohamed E. Daoud,Inas Taha, Mohamed Helal,H. Kamoutsi,G.N. Haidemenopoulos, Kamran A. Khan,Dalaver H. Anjum
ACS Applied Electronic Materials (2024)
Chemical Engineering Journalpp.153948, (2024)
Eswaravara Prasadarao Komarala, Aasif Asharafbhai Dabbawala, Messaoud Harfouche,Michalis A. Vasiliades,Nikolaos Charisiou,Dalaver H. Anjum,Samuel Mao,Magnus Rueping,Mark A. Baker,Maria A. Goula,Angelos M. Efstathiou,Kyriaki Polychronopoulou
Applied Surface Science (2024): 160388-160388
Vengatesan M. Rangaraj,Subramani Devaraju, Tenali Gangadhar Reddy, Humaira Zafer,Dalaver H. Anjum,Vikas Mittal
Materials Research Bulletinpp.112925, (2024)
ACS applied materials & interfacesno. 11 (2024): 14229-14242
Omer Elmutasim, Aseel G Hussien,Abhishek Sharan,Sara AlKhoori,Michalis A Vasiliades,Inas Magdy Abdelrahman Taha,Seokjin Kim, Messaoud Harfouche,Abdul-Hamid Emwas,Dalaver H Anjum,Angelos M Efstathiou,Cafer T Yavuz,
Chemical Engineering Journalpp.152351, (2024)
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Author Statistics
#Papers: 322
#Citation: 14755
H-Index: 60
G-Index: 116
Sociability: 7
Diversity: 4
Activity: 211
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