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个人简介
David R. Hughart (Member, IEEE) received the Ph.D. degree from Vanderbilt University in 2012. He is a Principal Member of the Technical Staff with Sandia National Laboratories. He has led projects investigating reliability characterization techniques for semiconductor devices and radiation effects experimentation and modeling, focusing on nonvolatile memory. He has previously led wafer level reliability for Sandia’s fab and helped develop Sandia’s resistive memory technology.
研究兴趣
论文共 77 篇作者统计合作学者相似作者
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IEEE Transactions on Nuclear Scienceno. 99 (2024): 1-1
T. Wallace,M. Spear,A. Privat,J. Neuendank, G. Irumva, D. Wilson,I. Sanchez Esqueda,H. J. Barnaby,M. Turowski,E. Mikkola,D. Hughart,M. J. Marinella,
IEEE Transactions on Nuclear Scienceno. 4 (2023): 620-626
B. Tolleson,Christopher H. Bennett,T. Patrick Xiao,Donald Wilson, J. Short, J. Kim,David R. Hughart, N. Gilbert,Sapan Agarwal,Hugh J. Barnaby,Matthew J. Marinella
IRPSpp.1-6, (2023)
IEEE Transactions on Nuclear Scienceno. 99 (2023): 1-1
IEEE Transactions on Nuclear Scienceno. 3 (2022): 1-1
Applied Physics Lettersno. 6 (2022): 063502-063502
The Review of scientific instrumentsno. 11 (2022): 115101-115101
Jereme Neuendank,Matthew Spear,Trace Wallace,Donald Wilson,Jose Solano, Gedeon Irumva,Ivan Sanchez Esqueda,Hugh J. Barnaby,Lawrence T. Clark,John Brunhaver,Marek Turowski, Esko Mikkola,
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)pp.1-9, (2022)
Proposed for presentation at the Materials Research Society Spring 2022 Meeting held May 8-13, 2022 in Honolulu, Hawaii. (2022)
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作者统计
#Papers: 75
#Citation: 688
H-Index: 14
G-Index: 25
Sociability: 6
Diversity: 1
Activity: 1
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