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Papers共 115 篇Author StatisticsCo-AuthorSimilar Experts
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IEEE VLSI Test Symposiumpp.1-5, (2024)
ASPDAC '24: Proceedings of the 29th Asia and South Pacific Design Automation Conferencepp.189-194, (2024)
IOLTSpp.1-7, (2023)
Gia Bao Thieu,Sven Gesper,Guillermo Paya-Vaya,Christoph Riggers, Oliver Renke, Till Fiedler, Jakob Marten,Tobias Stuckenberg,Holger Blume,Christian Weis,Lukas Steiner,Chirag Sudarshan,
2023 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, DATEpp.1-6, (2023)
Hirra Anwar, Saad Ullah Khan,Muhammad Mohsin Ghaffar,Muhammad Fayyaz,Muhammad Jawad Khan,Christian Weis,Norbert Wehn,Faisal Shafait
ICECS 2022pp.1-4, (2022)
2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC)pp.1-6, (2022)
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