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个人简介
Christian J. Long received the B.S. and Ph.D. degrees in physics from the University of Maryland at College Park, College Park, MD, USA, in 2004 and 2011, respectively.
His doctoral research focused on the development of both microwave near-field scanning probe microscopy techniques and new methods to analyze data from combinatorial materials experiments. From 2012 to 2015, he was a Postdoctoral Researcher with the National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA, where he focused on techniques for characterizing nanoscale materials. In 2016, he joined NIST, Boulder, CO, USA, as a Staff, where he currently leads a project on the development of on-chip standards for microwave and millimeter-wave calibration.
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论文共 6 篇作者统计合作学者相似作者
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Jerome Cheron, Rob D. Jones, Dylan F. Williams,Miguel E. Urteaga,Bryan T. Bosworth, Nicholas R. Jungwirth, Jeffrey A. Jargon,Benjamin F. Jamroz,Christian J. Long,Nathan D. Orloff,Ari D. Feldman, Peter H. Aaen
2024 IEEE Wireless and Microwave Technology Conference (WAMICON)pp.1-4, (2024)
Jacob T. Pawlik,Samantha L. Miller, Sarah R. Evans,Kathleen Schwarz,Nathan D. Orloff,Christian J. Long, James C. Booth,Angela C. Stelson
Meeting abstractsno. 53 (2023): 2649-2649
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Nikolas D. Barrera,Jacob T. Pawlik,Eugene J. Yoon, James C. Booth,Christian J. Long,Nathan D. Orloff, Ellis Meng,Angela C. Stelson
2023 22nd International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers)pp.1180-1183, (2023)
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Xiaohai Cui, Wei Yuan, Shilei Ding,Xiaomeng Liu,Jinwen Liu,Djamel Allal, Jürgen Rühaak,Karsten Kuhlmann,Yuya Tojima,Moto Kinoshita,Jae–Yong Kwon,Tae-Weon Kang,
Metrologiano. 1A (2023): 01001-01001
Jeffrey A. Jargon,Dylan F. Williams,Angela C. Stelson,Christian J. Long,Aaron M. Hagerstrom,Paul D. Hale,John R. Stoup,Eric S. Stanfield, Wei Ren
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