基本信息
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Bio
Chan-Soo Hwang (M'99) received the B.S. and M.S. degree in electrical engineering from Korea Advanced Institute of Science and Technology (KAIST), Daejon, Korea, in 1997 and 1999, respectively.
He joined Samsung Advanced Institute of Technology (SAIT), Kyungkido, Korea in 1999. He participated in the standardization of VDSL in ITU from 1999 to 2000. Since 2001, he has done research on next-generation wireless communication systems. His primary research interests include space-time codes, MIMO, and multicarrier modulation.
Research Interests
Papers共 167 篇Author StatisticsCo-AuthorSimilar Experts
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Jieun Song, Janghoon Kim,Hyung Jong Bae,Sudeok Kim, Soonmok Ha, Woojin Jung, Seokwon Cho, Jeounghun Park, Dohyeon Park, Eunji Lee, Minseung Song, Hyunseung Ha,
Optical and EUV Nanolithography XXXVII (2024)
Jungmin Lee, Doogyu Lee,Eunji Lee, Inbeom Yim,Jeongjin Lee,Seung Yoon Lee,Chan Hwang,Marc Noot, Arno van Leest,Simon Mathijssen, Yao Gao,Seung-Bin Yang,
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)
Inho Kwak, Nanhyung Kim, Inbeom Yim,Jeongjin Lee,Seung Yoon Lee,Chan Hwang, Pieter Brandt,Kateryna Lyakhova, Marco Mueller, Ferhad Kamalizadeh,Antonio Corradi,Yun-A Sung,
METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVII (2023)
Moosong Lee,Jinsun Kim, Dohyeon Park,Yeeun Han, Junseong Yoon,Seung Yoon Lee,Chan Hwang,Achim Woessner,Cyrus E. Tabery, Miao Wang,Antonio Corradi,Young-Hoon Song,
Metrology, Inspection, and Process Control XXXVI (2022)
Moosong Lee,Jinsun Kim, Dohyeon Park,Yeeun Han, Junseong Yoon,Seung Yoon Lee,Chan Hwang,Achim Woessner,Cyrus E. Tabery, Miao Wang,Antonio Corradi,Young-Hoon Song,
Doogyu Lee,Jungmin Lee,Eunji Lee,Jeongjin Lee,Seung Yoon Lee,Chan Hwang, Pieter Kapel,Seung-Bin Yang, Mi-Yeon Baek, Jeroen Wefers Bettink,Se-Ra Jeon,Thomas Kim,
Metrology, Inspection, and Process Control XXXVI (2022)
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXIV (2020)
Inbeom Yim, Koshiba Dakeshi,Chan Hwang,Seung Yoon Lee,Jeongjin Lee,Joon-Soo Park, Jenny Yueh,Ali Ghavami, Bart Segers, Miguel Garcia Granda, Yutao Gui, Eric Janda,
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXIV (2020)
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Author Statistics
#Papers: 168
#Citation: 4039
H-Index: 32
G-Index: 50
Sociability: 5
Diversity: 2
Activity: 9
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