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Papers共 64 篇Author StatisticsCo-AuthorSimilar Experts

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P-type SnO Semiconductor Transistor and Application
C. C. Wang, C. C. Kuo,C. H. Wu, A. Lu,H. Y. Lee, C. F. Hsu,P. J. Tzeng,T. Y. Lee,F. R. Hou, M. H. Chang, S. C. Lai, K. Goto,Shimeng Yu, C. I. Wu, C. T. Lin, Y. M. Lin,X. Y. Bao
Symposium on VLSI Technologypp.1-2, (2024)
Cited0Views0EIWOSBibtex
0
0
Low Voltage (<1.8 V) and High Endurance (>1M) 1-Selector/1-stt-mram with Ultra-Low (1 Ppb) Read Disturb for High Density Embedded Memory Arrays
E. Ambrosi,C. H. Wu, M. Y. Song,H. Y. Lee,K. S. Li, C. C. Lin, C. F. Hsu, C. C. Kuo,W. N. Chang, Y. J. Chen, C. H. Lin,J. M. Shieh,C. H. Shen,T. Y. Lee,T. H. Hou,X. Y. Bao
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
Cited0Views0EIWOSBibtex
0
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Investigation of First Fire Effect on VTH Stability and Endurance in GeCTe Selector
P. C. Chang,P. J. Liao, D. W. Heh, C. Lee,D. H. Hou,E. Ambrosi,C. H. Wu,H. Y. Lee,J. H. Lee,X. Y. Bao
2022 IEEE International Reliability Physics Symposium (IRPS) (2022)
Cited4Views0EIWOSBibtex
4
0
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Author Statistics

#Papers: 65

#Citation: 1505

H-Index: 24

G-Index: 35

Sociability: 6

Diversity: 2

Activity: 2

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