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Papers共 209 篇Author StatisticsCo-AuthorSimilar Experts
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C. -C. Wu,K. -T. Lin, I. G. N. Y. Handayana, C. -H. Chien, S. Goswami,G. -D. Lin,Y. -C. Chen,H. H. Jen
PHYSICAL REVIEW RESEARCHno. 1 (2024): 013159
Gordon Kuo,Chih-Yuan Chen,Cheng-Chieh Hsieh, Chung-Ju Lee,Jason Wu,Ji James Cui, Yen-Liang Kuo, Chih- Hang Tug,Terry Ku,Chung-Hao Tsai,Kuo-Chung Yee,Douglas C. N. Yu
2023 IEEE 73RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTCpp.1973-1976, (2023)
C. A. Lu, H. P. Lee,H. C. Chen,Y. C. Lin, Y. H. Chung,S. H. Wang,J. Y. Yeh,V. S. Chang,M. C. Chiang,W. Chang, H. C. Chung, C. F. Cheng,
VLSI Technology and Circuitspp.1-2, (2023)
H.-L. Chiang, R. A. Hadi, J.-F. Wang, H.-C. Han,J.-J. Wu, H.-H. Hsieh, J.-J. Horng,W.-S. Chou, B.-S. Lien,C.-H. Chang,Y.-C. Chen,Y.-H. Wang,
VLSI Technology and Circuitspp.1-2, (2023)
IEEE 72ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2022)pp.1025-1029, (2022)
Chih-Hao Chang,V. S. Chang,K. H. Pan, K. T. Lai, J. H. Lu, J. A. Ng,C. Y. Chen,B. F. Wu,C. J. Lin,C. S. Liang, C. P. Tsao, Y. S. Mor,
2022 INTERNATIONAL ELECTRON DEVICES MEETING, IEDMpp.27.1.1-27.1.4, (2022)
M.-C. Chen,S. Ohshita, S. Amano, Y. Kurokawa, S. Watanabe, Y. Imoto, Y. Ando, W.-H. Hsieh,C.-H. Chang,C.-C. Wu,S.-S. Chuang, H. Yoshida,
2022 International Electron Devices Meeting (IEDM) (2022)
H. -L. Chiang, J.-F. Wang, K. -H. Lin,C.-H. Nien,J. -J. Wu,K.-Y. Hsiang,C. -P. Chuu,Y.-W. Chen, X. W. Zhang,C. W. Liu,Tahui Wang,C. -C. Wang,
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)pp.361-362, (2022)
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Author Statistics
#Papers: 12
#Citation: 501
H-Index: 12
G-Index: 12
Sociability: 2
Diversity: 0
Activity: 0
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