基本信息
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Bio
Bruce R. Rae (Member, IEEE) received the M.Eng. and Ph.D. degrees in electrical and electronic engineering from the University of Edinburgh, U.K., in 2005 and 2009, respectively. He is a Photonics Pixel Architect and the Manager of the Device, Process and Optical Simulation Group, Imaging Division of STMicroelectronics, Edinburgh, U.K., where he works in close collaboration with the silicon, process, module and system R&D teams to define and develop the Imaging Division photonics pixel and technology roadmap and specification. In addition, he works with external collaborators on advanced R&D projects. He is a member of the Technical Program Committee and an European Regional Chair for IEEE ISSCC 2022.
Research Interests
Papers共 69 篇Author StatisticsCo-AuthorSimilar Experts
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S. Pellegrini,I. Nicholson,R. Helleboid,B. Mamdy, G. Forcolin, M. Al-Rawhani, C. Buj, G. Marchand,B. Rae,D. Golanski,G. Mugny,R. A. Bianchi,
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
D. Rideau,W. Uhring,R. A. Bianchi,R. Helleboid,G. Mugny, J. Grebot, J.R. Manouvrier, R. Neri, F. Brun,M. Dolatpoor Lakeh, S. Rink, J-B. Kammerer,
ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC)pp.144-147, (2023)
IEEE Open Journal of the Solid-State Circuits Society (2022): 12-25
S. Rink,V. Quenette, J.R. Manouvrier,A. Juge,G. Gouget,D. Rideau,R.A. Bianchi,D. Golanski,B. Mamdy,J.B. Kammerer,W. Uhring,C. Lallement,
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)pp.281-284, (2022)
2021 IEEE SENSORSpp.1-4, (2021)
High Performance Silicon Imagingpp.377-412, (2020)
semanticscholar(2019)
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