Brett C. Byram (Member, IEEE) received the B.S.E. degree in biomedical engineering and mathematics from Vanderbilt University, Nashville, TN, USA, in 2004, and the Ph.D. degree in biomedical engineering from Duke University, Durham, NC, USA, in 2011. He is currently an Associate Professor with the School of Engineering, Vanderbilt University and a Hoy Family Faculty Fellow. He has spent time at Siemens’ Ultrasound Business Unit, Mountain View, CA, USA, and he spent a year with the Jorgen Jensen’s Center for Fast Ultrasound, Lyngby, Denmark. He served as an Assistant Research Professor with Duke University from 2012 to 2013. He is also a part of the Vanderbilt Institute for Surgery and Engineering (VISE), Nashville, and an Affiliate with the Vanderbilt University Institute of Imaging Science (VUIIS), Nashville.