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Bin Shang graduated in communication engineering from Xidian University, Xi’an, China, in 2005. He has been a Researcher at the Key Laboratory of MIIT for Intelligent Products Testing and Reliability, CEPREI. He has long been engaged in the research of electronic information product testing technology, explored the integration of new technical means such as the Internet of Things, cloud computing, and big data with traditional testing and certification technology, and explored the innovation of using new technical means to improve the service mode of testing and certification.
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IEEE Transactions on Circuits and Systems for Video Technologyno. 9 (2023): 4588-4602
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